Estimation of remaining life using embedded SRAM for wearout parameter extraction

Abstract

Safety critical systems need methods for chips to monitor their health in the field. This paper proposes to use the embedded SRAM as a monitor of system health. The bit failures are tracked and the cause of each bit failure is diagnosed with on-chip built-in self test (BIST). The wearout model parameters are estimated from the diagnosis results and combined with system wearout simulation data to estimate the remaining lifetime of a system.