Suppression of information leakage from electronic devices based on SNR

T. Ikematsu, Yu-ichi Hayashi, T. Mizuki, N. Homma, T. Aoki, H. Sone
{"title":"Suppression of information leakage from electronic devices based on SNR","authors":"T. Ikematsu, Yu-ichi Hayashi, T. Mizuki, N. Homma, T. Aoki, H. Sone","doi":"10.1109/ISEMC.2011.6038440","DOIUrl":null,"url":null,"abstract":"Recently, the issue of information leakage through electromagnetic radiation has increasingly attracted attention. Using accumulated knowledge and experience, EMC-related committees have established guidelines on standardized acceptable values of EM radiation during device operation. Current electronic devices are usually designed so as to satisfy these EMC standards. However, the main aim of these standards is to reduce EM radiation that disturbs other devices, not radiation that leaks secret information. Even for EM radiation below the value specified in the guidelines, extraction of secret key information remains a possibility. In other words, unlike noise radiation in the field of EMC, there are no definite criteria regarding EM information leakage. Therefore, uncertainty remains as to whether conventional noise suppression techniques are applicable to the suppression of information leakage. This paper discusses the difference between using electromagnetic field suppression techniques for noise and for information by using a quantitative approach. Information leakage and effective countermeasures are investigated, based on a quantitative evaluation of the signal and noise components of the leakage.","PeriodicalId":440959,"journal":{"name":"2011 IEEE International Symposium on Electromagnetic Compatibility","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-10-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.2011.6038440","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10

Abstract

Recently, the issue of information leakage through electromagnetic radiation has increasingly attracted attention. Using accumulated knowledge and experience, EMC-related committees have established guidelines on standardized acceptable values of EM radiation during device operation. Current electronic devices are usually designed so as to satisfy these EMC standards. However, the main aim of these standards is to reduce EM radiation that disturbs other devices, not radiation that leaks secret information. Even for EM radiation below the value specified in the guidelines, extraction of secret key information remains a possibility. In other words, unlike noise radiation in the field of EMC, there are no definite criteria regarding EM information leakage. Therefore, uncertainty remains as to whether conventional noise suppression techniques are applicable to the suppression of information leakage. This paper discusses the difference between using electromagnetic field suppression techniques for noise and for information by using a quantitative approach. Information leakage and effective countermeasures are investigated, based on a quantitative evaluation of the signal and noise components of the leakage.
基于信噪比的电子设备信息泄漏抑制
近年来,通过电磁辐射泄露信息的问题日益引起人们的关注。电磁辐射相关委员会利用积累的知识和经验,制定了设备运行过程中电磁辐射的标准化可接受值的指导方针。目前的电子设备通常是为了满足这些EMC标准而设计的。然而,这些标准的主要目的是减少干扰其他设备的电磁辐射,而不是泄漏机密信息的辐射。即使对于低于指南中规定的值的电磁辐射,仍然有可能提取秘密密钥信息。也就是说,与电磁兼容领域的噪声辐射不同,电磁信息泄漏没有明确的标准。因此,传统的噪声抑制技术是否适用于信息泄漏的抑制仍然存在不确定性。本文讨论了用电磁场抑制技术抑制噪声和用定量方法抑制信息的区别。在定量评估泄漏信号和噪声成分的基础上,研究了信息泄漏和有效的应对措施。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信