Day 2: Invited talk spintronic microsystems: Integrating analog devices with CMOS

P. Freitas
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Abstract

One of the best know examples of integration of spintronic devices with CMOS is given by MRAM (magnetic random access memory), a digital memory where each node in its simplest form includes a switching element (transistor) in series with a magnetic tunnel junction (magnetic storage element). In the analog field, work is beginning in the design, fabrication, and back end integration of ASICS with magnetic sensors. This talk describes circuit design, integration process, fabrication and test of two different types of microsystems: a multiplexed protein/DNA biochip where an array of linear sensors (up to 256) fabricated on top of a 0.35um CMOS circuit detect in real time protein/DNA hibridization to immobilized probes. System noise (ASIC, sensor, fluidic environment) defines analyte minimum detectivity. A second example covers the design and fabrication of a non destructive testing platform, from the ASIC controlling sensor array readout, to the sensor array itself, consisting on an array of spin valve or magnetic tunnel junction elements. Depending on defect nature (buried or surface), signals need to be detected either at few hundred Hz, or at MHz level. System noise (ASIC and sensor noise) defines (for perfectly homogeneous samples) defect detection capability.
第二天:邀请演讲自旋电子微系统:集成模拟器件与CMOS
自旋电子器件与CMOS集成的最著名的例子之一是MRAM(磁性随机存取存储器),这是一种数字存储器,其中每个节点以其最简单的形式包括一个开关元件(晶体管)和一个磁性隧道结(磁存储元件)串联。在模拟领域,ASICS与磁传感器的设计、制造和后端集成工作已经开始。本演讲介绍了两种不同类型微系统的电路设计、集成过程、制造和测试:一种多路复用蛋白质/DNA生物芯片,其中在0.35um CMOS电路上制造的线性传感器阵列(最多256个)可以实时检测蛋白质/DNA杂交到固定探针。系统噪声(ASIC,传感器,流体环境)定义了分析物的最小检测能力。第二个例子涵盖了非破坏性测试平台的设计和制造,从ASIC控制传感器阵列读出到传感器阵列本身,由自旋阀阵列或磁隧道结元件组成。根据缺陷的性质(埋藏或表面),信号需要在几百赫兹或兆赫兹水平检测。系统噪声(ASIC和传感器噪声)定义(对于完全均匀的样品)缺陷检测能力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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