Qualification of 128 Gb MLC NAND Flash for SMAP space mission

2010 IEEE International Integrated Reliability Workshop Final Report Pub Date : 2010-10-01 DOI:10.1109/IIRW.2010.5706510

J. Heidecker, M. White, M. Cooper, D. Sheldon, F. Irom, D. Nguyen

引用次数: 2

Abstract

Screening and qualification of a 128 Gb multi-level-cell (MLC) NAND Flash device for the Soil Moisture Passive Active (SMAP) mission (http://smap.jpl.nasa.gov/) is presented here. The MLC technology used in this high density device requires testing above and beyond the typical space test flow.

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用于SMAP航天任务的128gb MLC NAND闪存鉴定

本文介绍了用于土壤湿度被动主动(SMAP)任务(http://smap.jpl.nasa.gov/)的128gb多级单元(MLC) NAND闪存器件的筛选和鉴定。在这种高密度设备中使用的MLC技术需要超出典型空间测试流程的测试。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2010 IEEE International Integrated Reliability Workshop Final Report

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