Techniques for electrical tree imaging

R. Schurch, S. Rowland, P. Withers
{"title":"Techniques for electrical tree imaging","authors":"R. Schurch, S. Rowland, P. Withers","doi":"10.1109/IST.2012.6295555","DOIUrl":null,"url":null,"abstract":"Electrical trees are defects which can grow in polymeric electrical insulation under high electrical stresses. Their name results from their visual aspect which resembles natural trees. The growth of electrical trees is a precursor to long-term electrical failure; however, the basic mechanism of tree initiation and growth is not yet understood, and remains an important issue for high voltage engineers and equipment designers. In this paper the various techniques used for visualising electrical trees are reviewed and the key research questions concerning the mechanism of tree growth are considered. Optical techniques are mainly used, although electron microscopy adds useful information about the morphology of the defect. Most work has been focused on two-dimensional images. A novel approach using X-ray computed tomography is presented in this paper. The challenges and opportunities for the imaging community are considered. Detailed imaging of incipient trees and sub-micron detail of growth regions hold keys to the mechanisms of growth, but methods such as X-ray tomography need further enhancement to yield useful data.","PeriodicalId":213330,"journal":{"name":"2012 IEEE International Conference on Imaging Systems and Techniques Proceedings","volume":"112 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE International Conference on Imaging Systems and Techniques Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IST.2012.6295555","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8

Abstract

Electrical trees are defects which can grow in polymeric electrical insulation under high electrical stresses. Their name results from their visual aspect which resembles natural trees. The growth of electrical trees is a precursor to long-term electrical failure; however, the basic mechanism of tree initiation and growth is not yet understood, and remains an important issue for high voltage engineers and equipment designers. In this paper the various techniques used for visualising electrical trees are reviewed and the key research questions concerning the mechanism of tree growth are considered. Optical techniques are mainly used, although electron microscopy adds useful information about the morphology of the defect. Most work has been focused on two-dimensional images. A novel approach using X-ray computed tomography is presented in this paper. The challenges and opportunities for the imaging community are considered. Detailed imaging of incipient trees and sub-micron detail of growth regions hold keys to the mechanisms of growth, but methods such as X-ray tomography need further enhancement to yield useful data.
电树成像技术
电树是在高电应力下聚合物电绝缘中生长的缺陷。它们的名字源于它们的外观类似于天然树木。电气树的生长是长期电气故障的前兆;然而,树形起始和生长的基本机制尚不清楚,这对于高压工程师和设备设计师来说仍然是一个重要的问题。本文综述了电树可视化的各种技术,并对电树生长机理的关键研究问题进行了探讨。主要使用光学技术,尽管电子显微镜增加了有关缺陷形态的有用信息。大多数工作都集中在二维图像上。本文提出了一种利用x射线计算机断层扫描的新方法。考虑了成像界面临的挑战和机遇。早期树木的详细成像和生长区域的亚微米细节是生长机制的关键,但x射线断层扫描等方法需要进一步增强才能产生有用的数据。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信