G. Duchamp, T. Dubois, A. Ayed, C. Marot, H. Frémont
{"title":"Measurement and simulation of electromagnetic drift for obsolescence management in electronics","authors":"G. Duchamp, T. Dubois, A. Ayed, C. Marot, H. Frémont","doi":"10.1109/EUROSIME.2015.7103162","DOIUrl":null,"url":null,"abstract":"This paper deals with a methodology based on both measurement and simulation approach to study the drift of system electromagnetic characteristics when modifications are made on an electronic board. The objective is to manage the obsolescence of components in electronic assemblies. The main applications involve aeronautical and automotive domains.","PeriodicalId":250897,"journal":{"name":"2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-04-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUROSIME.2015.7103162","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper deals with a methodology based on both measurement and simulation approach to study the drift of system electromagnetic characteristics when modifications are made on an electronic board. The objective is to manage the obsolescence of components in electronic assemblies. The main applications involve aeronautical and automotive domains.