A Quick and Intuitive Approach of Handeling In-Amp Failures Towards Lower Cycle Time and Improving Failure Mechanism Confidence and Quality

Abstract

The instrumentation amplifier products are high-volume runner products hence, also a high volume of returns are encountered at Failure Analysis Department. To solve each return would need a highly structured technique that requires extensive plot of results for the determination of proper failure mechanism. A perceptive approach that the Failure Analyst deal with in solving the different issues encountered is the compilation of failure data using commonality study of returns with summary that can easily be seen on a Measles chart. A compilation of complete list of historical analysis with circuit block layout designation, test methods, signature cases, microprobing and circuit analysis collaboration results are consolidated in one file to help guide the Analyst in determining the exact cause of failure, thus improving quality and turnaround time that translates to cycle time improvement of 56% CT days reduction hence creating value to the customer.