High level simulations of real-time built-in self-test of Σ-Δ A/D converters

Abstract

In this paper we discuss a possibility to simplify modeling and simulation of testing strategy of high-resolution ΣΔ modulators. The methodology could be used for production as well as for real time built-in self-tests. We show that a pseudo-random signal is a good option for a signal source and that test method leads to efficient and cost-effective testing that can also be used for real time built-in self-tests. The method is theoretically analyzed and verified using Matlab simulations. The models of DUT (device under test) and reference digital circuits are simulated and the difference is demonstrated with simple area-efficient algorithm/hardware.