Optical and structural characteristics of high-performance InGaN/GaN multiple quantum well light-emitting diodes: effects of nano-structural features

Z. S. Lee, Z. C. Feng, H. Tsai, J. Yang, A. G. Li, L. C. Chen, K. H. Chen, Y. F. Chen, Ian T. Ferguson, W. Lu
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引用次数: 1

Abstract

Optical and structural properties of InGaN/GaN multi-quantum well (MQW) structures with different well width, influenced by the nano-structural features in the MQWs, were investigated by optical measurements of photoluminescence (PL), photoluminescence excitation (PLE) and time-resolved photoluminescence (TRPL), as well as structural analysis methods, such as high-resolution X-ray diffraction (HRXRD) and high-resolution transmission electron microscopy (HRTEM) measurements. Due to the quantum confined Stark effect (QCSE), larger Stokes shift is induced with larger well width. Thermally activated carrier screening model is established to well describe the so-called S-shaped spectral shift with temperature. Inhomogeneous line-width broadening induced by piezoelectric field is found to be dominant at low temperature, while homogeneous line-width broadening due to phonon scattering takes over at higher temperature. Additionally, two activation energies are extracted from the Arrhenius plot of PL intensity. One is assigned to be the exciton binding energy and the other one the confinement energy of electrons in the quantum well. TRPL study further indicated that the radiative lifetime was decreased with the decreased well width. All these are associated with the In-composition fluctuation and nano-structures in the MQWs.
高性能InGaN/GaN多量子阱发光二极管的光学和结构特性:纳米结构特征的影响
采用光致发光(PL)、光致发光激发(PLE)和时间分辨光致发光(TRPL)等光学测量方法,以及高分辨率x射线衍射(HRXRD)和高分辨率透射电子显微镜(HRTEM)等结构分析方法,研究了不同井宽InGaN/GaN多量子阱(MQW)结构的光学和结构特性,以及MQW中纳米结构特征的影响。由于量子受限Stark效应(QCSE),较大的阱宽会引起较大的Stokes位移。建立了热激活载流子筛选模型,较好地描述了s型光谱随温度的变化。在低温下,由压电场引起的非均匀线宽展宽占主导地位,而在高温下,由声子散射引起的均匀线宽展宽占主导地位。此外,从PL强度的Arrhenius图中提取了两个活化能。一个被指定为激子结合能,另一个被指定为量子阱中电子的约束能。TRPL研究进一步表明,辐射寿命随着井宽的减小而减小。所有这些都与mqw的成分内波动和纳米结构有关。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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