A THEORETICAL MODEL FOR DESCRIPTION OF WORK FUNCTION LOWERING FOR SEMICONDUCTOR / INSULATOR UNDER THE INFLUENCE OF THE CHARGED BILAYER IN THE SURFACE REGION

M. Strikha, A. Goriachko
{"title":"A THEORETICAL MODEL FOR DESCRIPTION OF WORK FUNCTION LOWERING FOR SEMICONDUCTOR / INSULATOR UNDER THE INFLUENCE OF THE CHARGED BILAYER IN THE SURFACE REGION","authors":"M. Strikha, A. Goriachko","doi":"10.18524/1815-7459.2022.3.265293","DOIUrl":null,"url":null,"abstract":"We develop a simple theoretical model, connecting a  lowering of the electron affinity of a semiconductor  (or insulator) with such parameters as the density of  surface charge, localized on surface states or  adsorbed atoms, and the volume density of charge  within the space charge region, both of which form a charged bilayer on the surface. Our model allows to estimate the perspectiveness of various materials as films for creating modern photocathodes or effective field emission cathodes with substantially lowered or zero work function.","PeriodicalId":367487,"journal":{"name":"Sensor Electronics and Microsystem Technologies","volume":"58 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Sensor Electronics and Microsystem Technologies","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.18524/1815-7459.2022.3.265293","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

We develop a simple theoretical model, connecting a  lowering of the electron affinity of a semiconductor  (or insulator) with such parameters as the density of  surface charge, localized on surface states or  adsorbed atoms, and the volume density of charge  within the space charge region, both of which form a charged bilayer on the surface. Our model allows to estimate the perspectiveness of various materials as films for creating modern photocathodes or effective field emission cathodes with substantially lowered or zero work function.
一个描述表面带电双分子层影响下半导体/绝缘体功函数降低的理论模型
我们建立了一个简单的理论模型,将半导体(或绝缘体)的电子亲和力的降低与表面电荷密度、表面状态或吸附原子的密度以及空间电荷区域内电荷的体积密度等参数联系起来,两者在表面上形成带电双层。我们的模型允许估计各种材料作为薄膜的透视图,用于制造具有显着降低或零功函数的现代光电阴极或有效场发射阴极。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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