Development of 0.5 mm thick small outline packages

Y. Song, Seung-Ho Ahn, S. Oh
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引用次数: 0

Abstract

Two types of 0.5 mm thick UTSOP's (Ultra Thin Small Outline Packages) were developed, a conventional type with die pad, and a LOC(Lead on Chip) type. In both types, the die pad or the backside of the chip is exposed to the bottom of the package. In order to accomplish 0.5 mm thickness of the package, high strength alloy lead frames with 100 /spl mu/m thickness, and low-loop wire-bonding technology were used. The chip thicknesses in the conventional type, and the LOC type were 200 /spl mu/m and 300 /spl mu/m, respectively. Because, from the package structural point of view, the top half and the bottom half of the packages were unbalanced in terms of thermal expansion coefficients, the warpage of the packages was an expected problem. However, the warpage was reduced below 40 /spl mu/m by the material changes and the modification of lead frame design. Various molding compounds with different characteristics, and two kinds of lead frame materials were tried. Package reliability of the UTSOP's were evaluated.
开发0.5毫米厚的小轮廓包
开发了两种0.5 mm厚的UTSOP(超薄小轮廓封装),一种是带模垫的传统类型,另一种是LOC(芯片上导联)类型。在这两种类型中,晶片垫或芯片的背面都暴露在封装的底部。为了实现0.5 mm的封装厚度,采用了厚度为100 /spl mu/m的高强度合金引线框架和低环线接技术。常规型和LOC型的芯片厚度分别为200 /spl mu/m和300 /spl mu/m。因为从封装结构的角度来看,封装的上半部分和下半部分在热膨胀系数方面是不平衡的,因此封装的翘曲是一个预期的问题。然而,通过更换材料和修改引线框架设计,将翘曲量降低到40 /spl mu/m以下。试验了具有不同特性的各种成型化合物和两种引线框架材料。评估了UTSOP的包可靠性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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