METROLOGICAL RISKS AND STATE OF THE MONITORED OBJECTS

S. Yatsyshyn, R. Baitsar, S. Lazarenko, N. Lazarenko, R. Mastylo
{"title":"METROLOGICAL RISKS AND STATE OF THE MONITORED OBJECTS","authors":"S. Yatsyshyn, R. Baitsar, S. Lazarenko, N. Lazarenko, R. Mastylo","doi":"10.23939/istcmtm2022.01.017","DOIUrl":null,"url":null,"abstract":"The metrological risks of goods production are studied in the work. They are estimated conjugating with the existing technology as well as its metrological support. It is confirmed that in addition to the factors due to the processing of measurement results, the peculiarities of metrological support should be taken into account. One of the characteristic parameters of the metrological instruments is the variance of the measured value. Multiple measurements of the electrical resistance of the mentioned instruments - high-precision resistors designed for indirect measurement of current by measuring the voltage on them, using a DC bridge, were performed. The variance of obtained results is estimated, depending on the number of repeated measurements, the time interval between them, etc.","PeriodicalId":415989,"journal":{"name":"Measuring Equipment and Metrology","volume":"128 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Measuring Equipment and Metrology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23939/istcmtm2022.01.017","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

The metrological risks of goods production are studied in the work. They are estimated conjugating with the existing technology as well as its metrological support. It is confirmed that in addition to the factors due to the processing of measurement results, the peculiarities of metrological support should be taken into account. One of the characteristic parameters of the metrological instruments is the variance of the measured value. Multiple measurements of the electrical resistance of the mentioned instruments - high-precision resistors designed for indirect measurement of current by measuring the voltage on them, using a DC bridge, were performed. The variance of obtained results is estimated, depending on the number of repeated measurements, the time interval between them, etc.
被监测对象的计量风险和状态
对货物生产中的计量风险进行了研究。估计了它们与现有技术及其计量支持的共轭性。确定了除测量结果处理的因素外,还应考虑计量支承的特殊性。测量值的方差是计量仪器的特征参数之一。对上述仪器的电阻进行了多次测量-高精度电阻设计用于通过测量其上的电压来间接测量电流,使用直流电桥。根据重复测量的次数、它们之间的时间间隔等,估计所得结果的方差。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信