Reversi: Post-silicon validation system for modern microprocessors

I. Wagner, V. Bertacco
{"title":"Reversi: Post-silicon validation system for modern microprocessors","authors":"I. Wagner, V. Bertacco","doi":"10.1109/ICCD.2008.4751878","DOIUrl":null,"url":null,"abstract":"Verification remains an integral and crucial phase of todaypsilas microprocessor design and manufacturing process. Unfortunately, with soaring design complexities and decreasing time-to-market windows, todaypsilas verification approaches are incapable of fully validating a microprocessor before its release to the public. Increasingly, post-silicon validation is deployed to detect complex functional bugs in addition to exposing electrical and manufacturing defects. This is due to the significantly higher execution performance offered by post-silicon methods, compared to pre-silicon approaches. Validation in the post-silicon domain is predominantly carried out by executing constrained-random test instruction sequences directly on a hardware prototype. However, to identify errors, the state obtained from executing tests directly in hardware must be compared to the one produced by an architectural simulation of the designpsilas golden model. Therefore, the speed of validation is severely limited by the necessity of a costly simulation step. In this work we address this bottleneck in the traditional flow and present a novel solution for post-silicon validation that exposes its native high performance. Our framework, called Reversi, generates random programs in such a way that their correct final state is known at generation time, eliminating the need for architectural simulations. Our experiments show that Reversi generates tests exposing more bugs faster, and can speed up post-silicon validation by 20x compared to traditional flows.","PeriodicalId":345501,"journal":{"name":"2008 IEEE International Conference on Computer Design","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"54","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE International Conference on Computer Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCD.2008.4751878","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 54

Abstract

Verification remains an integral and crucial phase of todaypsilas microprocessor design and manufacturing process. Unfortunately, with soaring design complexities and decreasing time-to-market windows, todaypsilas verification approaches are incapable of fully validating a microprocessor before its release to the public. Increasingly, post-silicon validation is deployed to detect complex functional bugs in addition to exposing electrical and manufacturing defects. This is due to the significantly higher execution performance offered by post-silicon methods, compared to pre-silicon approaches. Validation in the post-silicon domain is predominantly carried out by executing constrained-random test instruction sequences directly on a hardware prototype. However, to identify errors, the state obtained from executing tests directly in hardware must be compared to the one produced by an architectural simulation of the designpsilas golden model. Therefore, the speed of validation is severely limited by the necessity of a costly simulation step. In this work we address this bottleneck in the traditional flow and present a novel solution for post-silicon validation that exposes its native high performance. Our framework, called Reversi, generates random programs in such a way that their correct final state is known at generation time, eliminating the need for architectural simulations. Our experiments show that Reversi generates tests exposing more bugs faster, and can speed up post-silicon validation by 20x compared to traditional flows.
用于现代微处理器的后硅验证系统
验证仍然是当今微处理器设计和制造过程中不可或缺的关键阶段。不幸的是,随着设计复杂性的飙升和上市时间的缩短,目前的验证方法无法在微处理器向公众发布之前对其进行完全验证。除了暴露电气和制造缺陷外,越来越多的后硅验证被用于检测复杂的功能缺陷。这是由于与前硅方法相比,后硅方法提供了更高的执行性能。后硅领域的验证主要是通过直接在硬件原型上执行约束随机测试指令序列来实现的。然而,为了识别错误,必须将直接在硬件中执行测试获得的状态与designsilas黄金模型的体系结构模拟产生的状态进行比较。因此,验证的速度受到昂贵的仿真步骤的限制。在这项工作中,我们解决了传统流程中的这一瓶颈,并提出了一种新的后硅验证解决方案,该解决方案暴露了其固有的高性能。我们的框架,称为Reversi,以这样一种方式生成随机程序,即在生成时知道它们的正确最终状态,从而消除了对架构模拟的需要。我们的实验表明,与传统流程相比,Reversi可以更快地生成暴露更多错误的测试,并且可以将硅后验证速度提高20倍。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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