A. Agarwal, B. Damsky, J. Richmond, S. Krishnaswami, C. Capell, S. Ryu, J. Palmour
{"title":"The first demonstration of the 1 cm /spl times/ 1 cm SiC thyristor chip","authors":"A. Agarwal, B. Damsky, J. Richmond, S. Krishnaswami, C. Capell, S. Ryu, J. Palmour","doi":"10.1109/ISPSD.2005.1487984","DOIUrl":null,"url":null,"abstract":"We report on the development of the first 1 cm /spl times/ 1 cm SiC thyristor chip capable of handling 1770 V. This demonstrates the present quality of the SiC substrate and epitaxial material. A forward drop of 4 V at 100 A and 200/spl deg/C was measured. The turn-on delay is found to be a strong function of the gate current. At a gate current of 1.5 A, the turn-on delay of 72 ns is observed for anode to cathode current, I/sub AK/=10 A. The turn-on rise time is a strong function of the anode to cathode voltage, V/sub AK/. At V/sub AK/=500 V, the turn-on rise time was 26 ns for I/sub AK/=10 A.","PeriodicalId":154808,"journal":{"name":"Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005.","volume":"37 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"13","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. ISPSD '05. The 17th International Symposium on Power Semiconductor Devices and ICs, 2005.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.2005.1487984","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 13
Abstract
We report on the development of the first 1 cm /spl times/ 1 cm SiC thyristor chip capable of handling 1770 V. This demonstrates the present quality of the SiC substrate and epitaxial material. A forward drop of 4 V at 100 A and 200/spl deg/C was measured. The turn-on delay is found to be a strong function of the gate current. At a gate current of 1.5 A, the turn-on delay of 72 ns is observed for anode to cathode current, I/sub AK/=10 A. The turn-on rise time is a strong function of the anode to cathode voltage, V/sub AK/. At V/sub AK/=500 V, the turn-on rise time was 26 ns for I/sub AK/=10 A.