Large-signal RF GaN HEMT simulation using Fermi Kinetics Transport

N. C. Miller, J. Albrecht, M. Grupen
{"title":"Large-signal RF GaN HEMT simulation using Fermi Kinetics Transport","authors":"N. C. Miller, J. Albrecht, M. Grupen","doi":"10.1109/DRC.2016.7548427","DOIUrl":null,"url":null,"abstract":"This article presents a computational framework which accurately simulates and characterizes a GaN HEMT power amplifier. The static I-V family is computed and compared to measurements to demonstrate the solver's accuracy, and the device simulation framework is verified by comparing the HB-FKT and T-FKT solvers. Load-pull simulations are used to optimize the amplifier performance by choosing an optimal load impedance. Finally, several figures of merit are presented with the optimal load.","PeriodicalId":310524,"journal":{"name":"2016 74th Annual Device Research Conference (DRC)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-08-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 74th Annual Device Research Conference (DRC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DRC.2016.7548427","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

This article presents a computational framework which accurately simulates and characterizes a GaN HEMT power amplifier. The static I-V family is computed and compared to measurements to demonstrate the solver's accuracy, and the device simulation framework is verified by comparing the HB-FKT and T-FKT solvers. Load-pull simulations are used to optimize the amplifier performance by choosing an optimal load impedance. Finally, several figures of merit are presented with the optimal load.
基于费米动力学输运的大信号射频GaN HEMT模拟
本文提出了一个精确模拟和表征GaN HEMT功率放大器的计算框架。计算了静态I-V族并与测量结果进行了比较,以证明求解器的准确性,并通过比较HB-FKT和T-FKT求解器验证了器件仿真框架。负载-拉仿真通过选择最优负载阻抗来优化放大器性能。最后,给出了最优负荷下的几个优值。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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