Quantifying the Benefits of Monolithic 3D Computing Systems Enabled by TFT and RRAM

Abdallah M. Felfel, K. Datta, Arko Dutt, H. Veluri, Ahmed Zaky, A. Thean, M. Aly
{"title":"Quantifying the Benefits of Monolithic 3D Computing Systems Enabled by TFT and RRAM","authors":"Abdallah M. Felfel, K. Datta, Arko Dutt, H. Veluri, Ahmed Zaky, A. Thean, M. Aly","doi":"10.23919/DATE48585.2020.9116410","DOIUrl":null,"url":null,"abstract":"Current data-centric workloads, such as deep learning, expose the memory-access inefficiencies of current computing systems. Monolithic 3D integration can overcome this limitation by leveraging fine-grained and dense vertical connectivity to enable massively-concurrent accesses between compute and memory units. Thin-Film Transistors (TFTs) and Resistive RAM (RRAM) naturally enable monolithic 3D integration as they are fabricated in low temperature (a crucial requirement). In this paper, we explore ZnO-based TFTs and HfO2-based RRAM to build a 1TFT-1R memory subsystem in the upper tiers. The TFT-based memory subsystem is stacked on top of a Si-FET bottom tier that can include compute units and SRAM. System-level simulations for various deep learning workloads show that our TFT-based monolithic 3D system achieves up to 11.4× system-level energy-delay product benefits compared to 2D baseline with off-chip DRAM—5.8× benefits over interposer-based 2.5D integration and 1.25× over 3D stacking of RRAM on silicon using through-silicon vias. These gains are achieved despite the low density of TFT-based RRAM and the higher energy consumption versus 3D stacking with RRAM, due to inherent TFT limitations.","PeriodicalId":289525,"journal":{"name":"2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/DATE48585.2020.9116410","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

Abstract

Current data-centric workloads, such as deep learning, expose the memory-access inefficiencies of current computing systems. Monolithic 3D integration can overcome this limitation by leveraging fine-grained and dense vertical connectivity to enable massively-concurrent accesses between compute and memory units. Thin-Film Transistors (TFTs) and Resistive RAM (RRAM) naturally enable monolithic 3D integration as they are fabricated in low temperature (a crucial requirement). In this paper, we explore ZnO-based TFTs and HfO2-based RRAM to build a 1TFT-1R memory subsystem in the upper tiers. The TFT-based memory subsystem is stacked on top of a Si-FET bottom tier that can include compute units and SRAM. System-level simulations for various deep learning workloads show that our TFT-based monolithic 3D system achieves up to 11.4× system-level energy-delay product benefits compared to 2D baseline with off-chip DRAM—5.8× benefits over interposer-based 2.5D integration and 1.25× over 3D stacking of RRAM on silicon using through-silicon vias. These gains are achieved despite the low density of TFT-based RRAM and the higher energy consumption versus 3D stacking with RRAM, due to inherent TFT limitations.
量化由TFT和RRAM实现的单片三维计算系统的好处
当前以数据为中心的工作负载,如深度学习,暴露了当前计算系统的内存访问效率低下。单片3D集成可以通过利用细粒度和密集的垂直连接来实现计算和内存单元之间的大规模并发访问,从而克服这一限制。薄膜晶体管(TFTs)和电阻式RAM (RRAM)可以在低温下制造(这是一个关键要求),因此可以自然地实现单片3D集成。在本文中,我们探索了基于zno的tft和基于hfo2的RRAM,以在上层构建1TFT-1R存储子系统。基于tft的内存子系统堆叠在Si-FET底层之上,底层可以包括计算单元和SRAM。各种深度学习工作负载的系统级模拟表明,与片外dram的2D基线相比,我们基于tft的单片3D系统实现了高达11.4倍的系统级能量延迟产品优势-与基于中间体的2.5D集成相比,优势为5.8倍,与使用透硅通孔的RRAM在硅上的3D堆叠相比,优势为1.25倍。尽管由于固有的TFT限制,基于TFT的RRAM密度较低,并且与使用RRAM的3D堆叠相比,能耗更高,但仍然可以实现这些增益。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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