Highly linear and sub 120 fs Ron × Coff 130 nm RF SOI technology targeting 5G carrier aggregation RF switches and FEM SOC

F. Gianesello, A. Monroy, V. Vialla, E. Canderle, G. Bertrand, M. Buczko, M. Coly, Jeff Nowakowski, N. Revil, L. Rolland, D. Gloria, A. Juge, S. Gachon, J. Aubert, E. Granger
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引用次数: 17

Abstract

RF front end modules (FEMs) are currently realized using a variety of technologies. However, since integration drives wireless business in order to achieve the appropriate cost and form factor, CMOS Silicon-on-insulator (SOI) has emerged over the past few years as the dominant technology for RF switches in RF FEMs for cell phones and WiFi [1]. While current performances available on RF SOI technology are already exceeding what was feasible using GaAs one, new cellular system such as carrier aggregation require even more stringent performances (linearity, power handling, insertion loss, isolation). To address those new requirements, RF SOI technology has to be improved. In this paper, the performances results of the latest generations of RF SOI switch technologies from STMicroelectronics are reviewed and technology elements that contribute to improved performance are discussed. Future improvements are also proposed, paving the way for RF SOI technology able to address 5G RF switches challenges.
针对5G载波聚合RF开关和FEM SOC的高度线性和低于120秒的Ron × Coff 130 nm RF SOI技术
射频前端模块(fem)目前使用多种技术实现。然而,由于集成驱动无线业务以实现适当的成本和外形因素,CMOS绝缘体上硅(SOI)在过去几年中已经成为手机和WiFi射频fem中射频开关的主导技术[1]。虽然目前射频SOI技术的可用性能已经超过了GaAs技术的可行性,但载波聚合等新型蜂窝系统需要更严格的性能(线性度、功率处理、插入损耗、隔离)。为了满足这些新的需求,射频SOI技术必须得到改进。本文综述了意法半导体最新一代射频SOI开关技术的性能结果,并讨论了有助于提高性能的技术要素。还提出了未来的改进,为能够解决5G RF开关挑战的RF SOI技术铺平了道路。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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