{"title":"Evaluation of the quality of the dielectric spectroscopy data","authors":"A. G. Karpov, V. A. Klemeshev","doi":"10.1109/BALD.2016.7886537","DOIUrl":null,"url":null,"abstract":"The dielectric spectroscopy data contains information on both the structure and internal bonds of the material and its functional properties. Due to the principles of dielectric spectroscopy, such measurements require rather complex processing algorithms.","PeriodicalId":328869,"journal":{"name":"2016 14th International Baltic Conference on Atomic Layer Deposition (BALD)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 14th International Baltic Conference on Atomic Layer Deposition (BALD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BALD.2016.7886537","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The dielectric spectroscopy data contains information on both the structure and internal bonds of the material and its functional properties. Due to the principles of dielectric spectroscopy, such measurements require rather complex processing algorithms.