InGaAsN as absorber in APDs for 1.3 micron wavelength applications

J. Ng, S. Tan, Y. L. Goh, C. H. Tan, J. David, J. Allam, S. Sweeney, A. Adams
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引用次数: 2

Abstract

Two issues with using InGaAsN as absorber in avalanche photodiodes (APDs) for 1310nm wavelength applications are addressed here. Firstly, we demonstrated InGaAsN p-i-n diodes with stable photoresponse around 1310nm but reverse leakage current density slightly above the acceptable limit of ~0.2mA/cm2 at 150kV/cm. We also investigated whether or not InGaAsN as absorber is compatible with Al0.8Ga0.2As (the proposed avalanche material in our separate-absorption-multiplication APD design) in terms of the relationship between α and β in InGaAsN. Our observations suggest α ~ β in InGaAsN, making it compatible with Al0.8Ga0.2As.
用于1.3微米波长应用的apd中的InGaAsN吸收剂
本文讨论了在1310nm波长雪崩光电二极管(apd)中使用InGaAsN作为吸收剂的两个问题。首先,我们展示了InGaAsN p-i-n二极管在1310nm左右具有稳定的光响应,但在150kV/cm时,反向泄漏电流密度略高于可接受的~0.2mA/cm2。我们还根据InGaAsN中α和β的关系,研究了InGaAsN作为吸收剂是否与Al0.8Ga0.2As(我们在分离吸收-倍增APD设计中提出的雪崩材料)兼容。我们的观察表明,InGaAsN中存在α ~ β,使其与Al0.8Ga0.2As兼容。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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