Liquid phase epitaxial III-V technology for photodetectors manufacturing

E. Venger, G. N. Semenova, T. Kryshtab, P. M. Lytvin, S. Krukovskii, R. Merker
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引用次数: 1

Abstract

The AlxGa1-xAs/GaAs heterostructures represent a potentially useful material for photodetectors with high efficiency in spectral range 0.4 divided by 0.9 micrometers . To produce the thermostable detectors with high radiation hardness on the base of liquid phase epitaxy (LPE) the physical and chemical foundation of such epilayers formation was developed. The abilities of LPE method wee improved due to utilization of multicomponent solution-melts with rare-earth additions. The horizontal sliding-boat step-cooled LPE technique with controlled composition of gaseous medium and additions of Yb in Bi and Ga-Bi-Al solution-melts was used as the base of technology. As a result of our investigation the quickly responsive photodiodes with improved technical, exploitative and economical parameters were produced.
用于光电探测器制造的液相外延III-V技术
在0.4 / 0.9微米的光谱范围内,AlxGa1-xAs/GaAs异质结构是一种潜在的有用的光电探测器材料。为了在液相外延(LPE)的基础上制备高辐射硬度的热稳定型探测器,研究了这种外延层形成的物理化学基础。添加稀土的多组分溶液熔体的使用提高了LPE法的性能。采用控制气体介质组成和在Bi和Ga-Bi-Al溶液熔体中添加Yb的水平滑船阶梯冷却LPE技术作为技术基础。通过研究,研制出了具有较好技术参数、开发参数和经济参数的快速响应光电二极管。
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