Reducing bitvector satisfiability problems to scale down design sizes for RTL property checking

P. Johannsen
{"title":"Reducing bitvector satisfiability problems to scale down design sizes for RTL property checking","authors":"P. Johannsen","doi":"10.1109/HLDVT.2001.972818","DOIUrl":null,"url":null,"abstract":"Formal bitvector theories have proven to be an adequate means of describing digital hardware at a higher level of design abstraction. Digital designs can be characterized by bitvector equations, such that design properties can be verified by determining satisfiability of such equations. Usually, satisfiability is checked in the Boolean domain by transforming systems of bitvector equations into Boolean formulae and afterwards applying bit-level verification techniques, like SAT and BDD procedures. The complexity of these methods often depends on the number of bit-level variables in the Boolean formulae, and thus depends on the sum of the widths of all bitvectors occurring in the equations. This paper presents a technique to reduce a system of equations over bitvectors of certain width into an equivalent system with smaller widths, while preserving satisfiability of the equations in a one-to-one fashion. The proposed reduction technique provides an efficient way to compute satisfying solutions of the original system from satisfying solutions found for the reduced system. We show how this technique can be used to speed up property checking of digital hardware by scaling down design sizes before verification.","PeriodicalId":188469,"journal":{"name":"Sixth IEEE International High-Level Design Validation and Test Workshop","volume":"77 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-12-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Sixth IEEE International High-Level Design Validation and Test Workshop","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HLDVT.2001.972818","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16

Abstract

Formal bitvector theories have proven to be an adequate means of describing digital hardware at a higher level of design abstraction. Digital designs can be characterized by bitvector equations, such that design properties can be verified by determining satisfiability of such equations. Usually, satisfiability is checked in the Boolean domain by transforming systems of bitvector equations into Boolean formulae and afterwards applying bit-level verification techniques, like SAT and BDD procedures. The complexity of these methods often depends on the number of bit-level variables in the Boolean formulae, and thus depends on the sum of the widths of all bitvectors occurring in the equations. This paper presents a technique to reduce a system of equations over bitvectors of certain width into an equivalent system with smaller widths, while preserving satisfiability of the equations in a one-to-one fashion. The proposed reduction technique provides an efficient way to compute satisfying solutions of the original system from satisfying solutions found for the reduced system. We show how this technique can be used to speed up property checking of digital hardware by scaling down design sizes before verification.
减少位向量可满足性问题,以缩小RTL属性检查的设计尺寸
形式化的位向量理论已被证明是在更高的设计抽象层次上描述数字硬件的适当手段。数字设计可以用位向量方程来表征,这样设计特性就可以通过确定这些方程的可满足性来验证。通常,通过将位向量方程系统转换为布尔公式,然后应用位级验证技术(如SAT和BDD程序)来检查布尔域的可满足性。这些方法的复杂性通常取决于布尔公式中位级变量的数量,因此取决于方程中出现的所有位向量的宽度之和。本文提出了一种将具有一定宽度的位向量的方程组简化为具有更小宽度的等价方程组的技术,同时以一对一的方式保持方程组的可满足性。所提出的约简技术提供了一种有效的方法,可以从被约简系统的满足解中计算出原系统的满足解。我们展示了如何使用该技术在验证之前通过缩小设计尺寸来加快数字硬件的属性检查。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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