A 110 mW 6 bit 36 GS/s interleaved SAR ADC for 100 GBE occupying 0.048 mm2 in 32 nm SOI CMOS

L. Kull, Jan Plíva, T. Toifl, M. Schmatz, P. Francese, C. Menolfi, M. Braendli, M. Kossel, T. Morf, T. Andersen, Y. Leblebici
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引用次数: 19

Abstract

An area- and power-optimized asynchronous 32× interleaved SAR ADC achieving 36 GS/s at 110mW with 1V supply on the interleaver and 0.9 V on the SAR ADCs is presented. The ADC features a 2-channel interleaver with data demultiplexing for enhanced bandwidth, a power- and area-optimized binary SAR ADC, and an area-optimized clocked reference buffer with a tunable constant-current source. It achieves 32.6dB SNDR up to 3GHz and 31.6dB up to 18GHz input frequency and 98fJ/conversion-step with a core chip area of 340×140μm2 in 32nm SOI CMOS technology.
用于100gbe的110mw 6位36gs /s交错SAR ADC,占地0.048 mm2,采用32nm SOI CMOS
提出了一种面积和功率优化的异步32×交错SAR ADC,在110mW下,交错器电源为1V, SAR ADC电源为0.9 V,达到36gs /s。该ADC具有2通道交织器,具有增强带宽的数据解复用功能,具有功率和面积优化的二进制SAR ADC,以及具有可调谐恒流源的面积优化时钟参考缓冲器。采用32nm SOI CMOS技术,在3GHz频率下实现32.6dB SNDR,在18GHz输入频率下实现31.6dB SNDR,实现98fJ/转换步进,核心芯片面积为340×140μm2。
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