Microwave Dissipation Spectra in Arrays of Silicon Nanowires

M. Lee, C. Highstrete, A. Vallett, S. Dilts, J. Redwing, T. Mayer
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Abstract

The transmission and reflection scattering parameters of arrays of silicon nanowires (SiNWs) directly assembled onto co-planar waveguides (CPWs) have been measured from 0.1 to 50 GHz at room temperature. Typical arrays consisted of between 103 to 104 SiNWs aligned parallel to the electric field polarization of the propagating microwave field. Scattering parameters were measured on CPWs both before and after nanomaterial assembly. Highly reproducible CPW characteristics and careful use of control samples to quantify systematic reproducibility allowed clear separation of nanomaterial effects from the characteristics of the bare CPWs. Arrays of n doped SiNWs consistently showed frequency-dependent power dissipation. Nominally undoped SiNW arrays, however, showed no measurable microwave power dissipation up to 50 GHz.
硅纳米线阵列中的微波耗散谱
在室温下测量了共面波导(cpw)上直接装配的硅纳米线阵列在0.1 ~ 50 GHz范围内的透射和反射散射参数。典型的阵列由103到104个sinw组成,平行于传播微波场的电场极化。在纳米材料组装前后测量了cpw的散射参数。高度可重复的CPW特性和仔细使用对照样品来量化系统的可重复性,可以将纳米材料效应与裸CPW的特性明确分离。n掺杂SiNWs阵列始终显示频率相关的功耗。然而,名义上未掺杂的SiNW阵列没有显示出高达50 GHz的可测量微波功率损耗。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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