Experimental Estimation of Input Offset Voltage Radiation Degradation Rate in Bipolar Operational Amplifiers

2019 IEEE 31st International Conference on Microelectronics (MIEL) Pub Date : 2019-09-01 DOI:10.1109/MIEL.2019.8889637

A. Bakerenkov, V. Pershenkov, V. Felitsyn, A. Rodin, V. Telets, V. Belyakov, A. Zhukov, N. Gluhov

引用次数: 2

Abstract

Radiation degradation rate of input offset voltage in bipolar operational amplifiers was estimated experimentally. High degradation rate was observed in devices with high input offset voltage initial values and temperature drifts. Obtained results were discussed.

查看原文本刊更多论文

双极运算放大器输入偏置电压辐射衰减率的实验估计

实验估计了双极运算放大器输入偏置电压的辐射衰减率。在高输入偏置电压初始值和温度漂移的器件中观察到高降解率。对所得结果进行了讨论。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

2019 IEEE 31st International Conference on Microelectronics (MIEL)

自引率

0.00%

发文量