Analytical, numerical and experimental approach to thermal analysis and design of a travelling wave tube

W. Wiejak, A. Wymyslowski
{"title":"Analytical, numerical and experimental approach to thermal analysis and design of a travelling wave tube","authors":"W. Wiejak, A. Wymyslowski","doi":"10.1109/EUROSIME.2015.7103098","DOIUrl":null,"url":null,"abstract":"Simulation of thermal energy transport in complicated structures is usually a challenge. An example of such problem is heat generation and transfer through microwave delay structure in the travelling wave tube (TWT) device. A high level of microwave power and considerable energy of electrons intercepted by the delay line leads to the increase of local temperature of the microwave structure. Determination of the heat transfer from the hot spots is essential for the proper design of the delay line and assisting cooling system. This problem has been investigated by means of a combined: analytical, numerical and experimental approach. Such methodology does not require expensive equipment and is much faster than the pure experimental analysis. Presented analytical model is focused on evaluation of the electron beam power dissipation and microwave losses along the delay line, which is not uniform and most of the power is dissipated at terminal part of the delay line. The analytically evaluated power dissipation was used in numerical simulation in order to assess the temperature distribution. Finally the results were validated experimentally using a designed measuring setup. One of the final conclusions was that the temperature distribution has a nonuniform character and the resulting high temperatures at the delay line output can significantly influence the device reliability parameters.","PeriodicalId":250897,"journal":{"name":"2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-04-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUROSIME.2015.7103098","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Simulation of thermal energy transport in complicated structures is usually a challenge. An example of such problem is heat generation and transfer through microwave delay structure in the travelling wave tube (TWT) device. A high level of microwave power and considerable energy of electrons intercepted by the delay line leads to the increase of local temperature of the microwave structure. Determination of the heat transfer from the hot spots is essential for the proper design of the delay line and assisting cooling system. This problem has been investigated by means of a combined: analytical, numerical and experimental approach. Such methodology does not require expensive equipment and is much faster than the pure experimental analysis. Presented analytical model is focused on evaluation of the electron beam power dissipation and microwave losses along the delay line, which is not uniform and most of the power is dissipated at terminal part of the delay line. The analytically evaluated power dissipation was used in numerical simulation in order to assess the temperature distribution. Finally the results were validated experimentally using a designed measuring setup. One of the final conclusions was that the temperature distribution has a nonuniform character and the resulting high temperatures at the delay line output can significantly influence the device reliability parameters.
行波管热分析与设计的分析、数值与实验方法
复杂结构中热能输运的模拟通常是一个挑战。这类问题的一个例子是行波管(TWT)器件中通过微波延迟结构产生和传递热量。高水平的微波功率和延迟线截获的大量电子能量导致微波结构局部温度升高。确定热点的热传递对延迟线和辅助冷却系统的合理设计至关重要。用分析、数值和实验相结合的方法研究了这个问题。这种方法不需要昂贵的设备,而且比纯实验分析快得多。所提出的分析模型侧重于计算电子束沿延迟线的功率损耗和微波损耗,而延迟线沿延迟线的损耗是不均匀的,大部分的功率损耗都在延迟线的末端部分。在数值模拟中采用解析计算的功率耗散来评估温度分布。最后利用设计的测量装置对实验结果进行了验证。最后得出的结论之一是,温度分布具有非均匀性,在延迟线输出处产生的高温会显著影响器件的可靠性参数。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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