R. Morohashi, Y. Kasai, Masahiro Uchiyama, T. Kawakami, Y. Yamagata
{"title":"Influence of External Cavity Configuration on the Failure Mode of High Power Wavelength Stabilized Laser Diode","authors":"R. Morohashi, Y. Kasai, Masahiro Uchiyama, T. Kawakami, Y. Yamagata","doi":"10.23919/ISLC52947.2022.9943408","DOIUrl":null,"url":null,"abstract":"Failure mode of high power laser diode under wavelength stabilized operation is investigated. Differences in the external cavity layout is found to affect near-field pattern inhomogeneity which is induced by optical feedback, resulting in a significant impact on the ratio of facet failure.","PeriodicalId":443954,"journal":{"name":"2022 28th International Semiconductor Laser Conference (ISLC)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 28th International Semiconductor Laser Conference (ISLC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/ISLC52947.2022.9943408","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Failure mode of high power laser diode under wavelength stabilized operation is investigated. Differences in the external cavity layout is found to affect near-field pattern inhomogeneity which is induced by optical feedback, resulting in a significant impact on the ratio of facet failure.