Tuning of electron occupancy in luminescence of single InP/GaInP quantum dot

L. Samuelson, D. Hessman, J. Persson, M. Pistol, C. Pryor, W. Seifert
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Abstract

Summary form only given. Macro- as well as micro-photoluminescence studies of InP/GaInP quantum dots (QDs) fabricated via the Stranski-Krastanow growth mode always show multiple luminescence lines, with an unexpected spectral width even for an individual QD. The origin of this unusual behavior has been debated and until now no clear picture has emerged. We have recently developed a new spectroscopic tool in which we can follow the luminescence of a single QD during the application of an electric field via a transparent Schottky barrier on the surface of the GaInP barrier material. This enables us to follow the evolution of each of the peaks as function of applied bias, with respect to (i) spectral shifts, (ii) intensities and (iii) line-widths. We will present experimental data and computer simulation results which show that during optical illumination with intensities such that luminescence is detected, a condition very close to flat-band is obtained and an open-circuit voltage corresponding to the Schottky-barrier height is detected.
单个InP/GaInP量子点发光中电子占位的调谐
只提供摘要形式。通过Stranski-Krastanow生长模式制备的InP/GaInP量子点(QDs)的宏观和微观光致发光研究总是显示出多条发光线,即使对于单个量子点也具有意想不到的光谱宽度。这种不寻常行为的起源一直存在争议,直到现在还没有清晰的图像出现。我们最近开发了一种新的光谱工具,通过GaInP势垒材料表面的透明肖特基势垒,我们可以在电场作用期间跟踪单个量子点的发光。这使我们能够跟踪每个峰的演变,作为应用偏置的函数,相对于(i)光谱位移,(ii)强度和(iii)线宽。我们将提供的实验数据和计算机模拟结果表明,在光学照明强度下,可以检测到发光,获得非常接近平带的条件,并检测到与肖特基势垒高度相对应的开路电压。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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