Device SEE susceptibility from heavy ions (1995-1996)

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference Pub Date : 1997-07-24 DOI:10.1109/REDW.1997.629790

D. Nichols, J. Coss, T. Miyahira, H. Schwartz, G. Swift, R. Koga, W. Crain, K. Crawford, S. Penzin

引用次数: 17

Abstract

A seventh set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications. SEE trends are indicated for several functional classes of ICs.

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重离子对器件SEE的敏感性(1995-1996)

自上次IEEE出版物以来，已经收集了第七组重离子单事件效应(SEE)测试数据。几个功能类别的集成电路显示了SEE趋势。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference

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