A 7b 1.4GS/s ADC with offset drift suppression techniques for one-time calibration

Yuji Nakajima, Norihito Kato, Akemi Sakaguchi, Toshio Ohkido, Kenji Shimomaki, H. Masuda, Chikahiro Shiroma, M. Yotsuyanagi, T. Miki
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引用次数: 6

Abstract

A 7b 1.4 GS/s flash ADC is developed in 45 nm CMOS. This is the first paper of an ADC with offset drift suppression techniques for dynamic comparator and preamplifier. These techniques make the ADC robust against environmental variation. As a result, once the ADC is calibrated at power up, no more calibration is necessary even under VDD or temperature variations. The ADC occupies a small area of 0.085 mm2 and dissipates 33.24 mW at 1.4 GS/s from a 1.15V supply.
7b 1.4GS/s ADC,带偏移漂移抑制技术,可进行一次性校准
在45nm CMOS芯片上研制了7b1.4 GS/s闪存ADC。这是第一篇采用偏置漂移抑制技术的ADC用于动态比较器和前置放大器的论文。这些技术使ADC对环境变化具有鲁棒性。因此,一旦ADC在上电时进行校准,即使在VDD或温度变化下也不需要更多的校准。ADC占地0.085 mm2的小面积,在1.15V电源下,功耗为1.4 GS/s,为33.24 mW。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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