Using electromagnetic emanations for variability characterization in Flash-based FPGAs

J. Tarrillo, Jorge Tonfat, F. Kastensmidt, R. Reis, Florent Bruguier, M. Bourree, P. Benoit, L. Torres
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引用次数: 2

Abstract

An ElectroMagnetic analysis (EMA) technique is applied to Flash-based FPGA (Field Programmable Gate Arrays) ProASIC3E to measure the delay variability. Measurements show that delay variations can reach 40% according to the mapping, placement and routing used in the FPGA array, while the synthesis tool analysis show differences lower than 7%. Comparisons between the use of EMA technique in Flash and SRAM-based FPGAs are presented. The Flash-based FPGA configurable blocks and routing structures are modeled at the electrical level. Then, SPICE simulations are performed to compare the predictive variability to the measurements ones. Results obtained with EMA can support designers on selecting different parts of the FPGA array, such as distinct mapping, placements and routing wires according to application and provide a valuable feedback for the FPGA's manufacture company.
在基于flash的fpga中使用电磁辐射进行可变性表征
将电磁分析(EMA)技术应用于基于flash的FPGA(现场可编程门阵列)ProASIC3E来测量延迟可变性。测量表明,根据FPGA阵列中使用的映射、放置和路由,延迟变化可达40%,而综合工具分析显示差异低于7%。比较了EMA技术在Flash和基于sram的fpga中的应用。基于flash的FPGA可配置模块和路由结构在电气层面进行了建模。然后,进行SPICE模拟以比较预测变异性与测量变异性。使用EMA获得的结果可以支持设计人员根据应用选择FPGA阵列的不同部分,例如不同的映射,放置和布线,并为FPGA制造公司提供有价值的反馈。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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