Application of Big Data Science in High Reliability Automotive Wafer Yield Management System and Failure Analysis

Abstract

The system automatically produces yield reports, shipping reports, real-time yield monitoring and statistics, abnormal cause statistics, Yield Chart, etc., to assist manufacturing, process, integration and other personnel to quickly Obtain the finished product/work in process yield report, and grasp the product yield information in real time, and find possible yield problems in real time. With the yield analysis tool provided by this system, we can quickly find the possible abnormal reasons to reduce the abnormal yield rate and the impact of production lines and shipments.