{"title":"Electrical characterization and modeling of FDSOI MOSFETs for Cryo-Electronics","authors":"M. Cassé, B. C. Paz, G. Ghibaudo, M. Vinet","doi":"10.1109/WOLTE55422.2022.9882859","DOIUrl":null,"url":null,"abstract":"We present an overview of DC electrical characterization of FDSOI transistors down to very low temperature for cryogenic applications. We also highlight specific phenomena appearing at low temperature, and discuss the corresponding physical and analytical models.","PeriodicalId":299229,"journal":{"name":"2022 IEEE 15th Workshop on Low Temperature Electronics (WOLTE)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE 15th Workshop on Low Temperature Electronics (WOLTE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WOLTE55422.2022.9882859","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
We present an overview of DC electrical characterization of FDSOI transistors down to very low temperature for cryogenic applications. We also highlight specific phenomena appearing at low temperature, and discuss the corresponding physical and analytical models.