Novel Bi-directional tunneling program/erase NOR (BiNOR) type flash EEPROM

Abstract

This paper presents a novel Bi-directional channel FN tunneling program/erase NOR (BiNOR) type flash memory cell for the reliable, high speed, and low power operation. With the localized shallow p-well at bit-line, BiNOR realizes low power channel FN tunneling program/erase in a NOR-type array architecture, which could only be done previously in a NAND array architecture. Furthermore, the read current is enhanced greatly by the 3-D conduction effect due to the designated shallow p-well.