New silicon devices beyond CMOS

E. Suzuki, K. Ishii, T. Sekigawa
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引用次数: 1

Abstract

Silicon technologies have successively progressed in past half a century. To continue the development in the 21 at century, we need to consider and prepare new silicon devices in the range of deca-nano-meter. The suppression of the short-channel effect improving device performance is an important consideration in such an ultrasmall device. We review the development of the double-gate-type MOS device as an emerging device, and discuss the technology directions.
超越CMOS的新型硅器件
在过去的半个世纪里,硅技术不断取得进步。为了在21世纪继续发展,我们需要考虑和制备十纳米范围内的新型硅器件。在这种超小型器件中,抑制短通道效应是提高器件性能的重要考虑因素。回顾了双栅型MOS器件作为一种新兴器件的发展历程,并对其技术方向进行了讨论。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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