Compensation mechanism and transport behaviour of semi-insulating GaAs:Cu

B.H. Yang, D. Seghier, H. Gíslason
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引用次数: 3

Abstract

Semi-insulating conditions are obtained by copper diffusion of n-type GaAs in a conventional compensation process accompanied by an apparent transformation of the EL2 donor into another deep donor that pins the Fermi level. The anomalous temperature dependence of the low electron Hall mobility of the GaAs:Cu samples significantly differs from the usual one in undoped semi-insulating samples. It is suggested that potential fluctuations caused by inhomogeneous impurity distribution in the closely compensated samples may be responsible for the anomalous conduction which is similar to that observed in different types of inhomogeneous semi-insulating material.
半绝缘GaAs:Cu的补偿机制和输运行为
在传统的补偿过程中,n型GaAs的铜扩散伴随着EL2供体向另一个固定费米能级的深层供体的明显转变,从而获得了半绝缘条件。GaAs:Cu样品的低电子霍尔迁移率的异常温度依赖性与通常未掺杂的半绝缘样品有显著不同。结果表明,与在不同类型的非均匀半绝缘材料中观察到的异常导电现象类似,在紧密补偿样品中杂质分布不均匀引起的电位波动可能是导致异常导电的原因。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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