Comprehensive statistical investigation of STT-MRAM thermal stability

Abstract

The thermal stability Δ is a key parameter of the MRAM technology. It determines the current induced switching behavior as well as the reliability performance of e.g. data retention and read-disturb. Therefore a highly accurate assessment of Δ is mandatory for a successful MRAM technology development. In this paper we present a verification methodology based on the statistical data of a 8Mb test vehicle revealing a wide Δ distribution of ~17%.