{"title":"A 0.5-to-1 V 9-bit 15-to-90 MS/s digitally interpolated pipelined-SAR ADC using dynamic amplifier","authors":"James Lin, Zule Xu, M. Miyahara, A. Matsuzawa","doi":"10.1109/ASSCC.2014.7008866","DOIUrl":null,"url":null,"abstract":"This paper presents a 0.5-to-1 V, 9-bit, 15-to-90 MS/s digitally interpolated pipelined-SAR ADC. The proposed digital interpolation alleviates the inter-stage gain requirement of a pipelined-SAR ADC making this ADC insensitive to gain variation. With a relaxed gain requirement, an open-loop dynamic amplifier is employed as the residue amplifier making the proposed design high-speed, clock-scalable, and robust to supply voltage scaling. The prototype ADC fabricated in 65 nm CMOS demonstrates an ENOB of 7.88 bits up to 30 MS/s with an input close to the Nyquist frequency at 0.6 V. At this conversion rate, it consumes 0.48 mW resulting in a FoM of 68 fJ/conv.-step.","PeriodicalId":161031,"journal":{"name":"2014 IEEE Asian Solid-State Circuits Conference (A-SSCC)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE Asian Solid-State Circuits Conference (A-SSCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASSCC.2014.7008866","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
This paper presents a 0.5-to-1 V, 9-bit, 15-to-90 MS/s digitally interpolated pipelined-SAR ADC. The proposed digital interpolation alleviates the inter-stage gain requirement of a pipelined-SAR ADC making this ADC insensitive to gain variation. With a relaxed gain requirement, an open-loop dynamic amplifier is employed as the residue amplifier making the proposed design high-speed, clock-scalable, and robust to supply voltage scaling. The prototype ADC fabricated in 65 nm CMOS demonstrates an ENOB of 7.88 bits up to 30 MS/s with an input close to the Nyquist frequency at 0.6 V. At this conversion rate, it consumes 0.48 mW resulting in a FoM of 68 fJ/conv.-step.