Effective Characterization of Radiation-induced SET on Flash-based FPGAs

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS) Pub Date : 2017-10-01 DOI:10.1109/RADECS.2017.8696255

L. Sterpone, S. Azimi

引用次数: 2

Abstract

Single Event Transients (SETs) are one of the major concern for Flash-based Field Programmable Gate Arrays (FPGAs). In this paper, we propose a new analysis to characterize the SET phenomena within Flash-based FPGAs.

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基于flash的fpga上辐射诱导SET的有效表征

单事件瞬变(set)是基于flash的现场可编程门阵列(fpga)的主要关注点之一。在本文中，我们提出了一种新的分析方法来表征基于flash的fpga中的SET现象。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS)

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