Simulation based design methodology for affordable performance of vacuum electron devices

Abstract

Since future military systems are likely to require a relatively small number of highly specialized vacuum electron devices, a reduction of development costs will have a significant impact on the total cost of the device. Experimental testing cycles can be reduced or eliminated through the use of a new, simulation-based design methodology, thereby reducing the time and cost of development. This paper will describe recent progress in the development of such design tools for vacuum electronics and will present plans for future developments in this area.As an example, the measured transfer characteristic of a CPI Ku-band TWT is compared with CHRISTINE3D calculations.