{"title":"Physics of AlGaAs compounds for sensing applications","authors":"J. Robert, V. Mosser, S. Contreras","doi":"10.1109/SENSOR.1991.148867","DOIUrl":null,"url":null,"abstract":"It is shown that a new type of monolithic pressure sensor for high-pressure operation can be developed using the scientific properties of deep impurity states (so-called DX centers) in III-V semiconducting compounds. Due to the large intrinsic sensitivity of these tapping levels to hydrostatic pressure, all mechanical problems related to the use of a diaphragm at high pressure can be avoided. This approach is also based on the possibilities offered by band gap engineering: the development of very clean and well-controlled epitaxial growth techniques (molecular beam epitaxy, metal-organic chemical vapor deposition) opens new opportunities for measuring device applications. Particular attention is given to GaAlAs solid-state pressure sensors (passive 3-D sensors and active 2-D sensors).<<ETX>>","PeriodicalId":273871,"journal":{"name":"TRANSDUCERS '91: 1991 International Conference on Solid-State Sensors and Actuators. Digest of Technical Papers","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"TRANSDUCERS '91: 1991 International Conference on Solid-State Sensors and Actuators. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SENSOR.1991.148867","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
It is shown that a new type of monolithic pressure sensor for high-pressure operation can be developed using the scientific properties of deep impurity states (so-called DX centers) in III-V semiconducting compounds. Due to the large intrinsic sensitivity of these tapping levels to hydrostatic pressure, all mechanical problems related to the use of a diaphragm at high pressure can be avoided. This approach is also based on the possibilities offered by band gap engineering: the development of very clean and well-controlled epitaxial growth techniques (molecular beam epitaxy, metal-organic chemical vapor deposition) opens new opportunities for measuring device applications. Particular attention is given to GaAlAs solid-state pressure sensors (passive 3-D sensors and active 2-D sensors).<>