Numerical fluidic-chemical multi-physics simulation of a mass production model for electroless plating of fine-pitch interconnections in a microchannel for chip packaging applications

S. J. Gräfner, J.H. Huang, P. Shih, V. Renganathan, P. Kung, Y.A. Chen, C.H. Huang, C. Chen, C. Kao
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Abstract

Current chip packaging technologies for fine-pitch interconnections require high heat and pressure which could lead to failures on the surrounding delicate parts in the scaling-down process. By using electroless plating instead, these limitations could be avoided which already has been demonstrated in various experiments. However, the transition from experiments in the laboratory to the industrial fabrication has to face various challenges. A numerical multi-physics model to investigate the fluidic-chemical aspects while scaling-down the geometry for a possible mass production is developed. By the usage of this model, possible limitations, theoretical requirements and optimizations on the packaging system can be estimated and investigated. The results show that the pressure gradient of the model follows Darcy's law for porous medium. Furthermore, pillar couplings with gap usually have a non-uniform grow behavior. This non-uniformity can be optimized by applying a dome-shaped pillar-tip. Moreover, the convectional flux is in most of the samples of the domain dominant. Only by approaching the reactions surface, diffusion becomes a relevant part of the mass transport. The investigation of the Cu-ion concentration gradient shows that more Cu-ions are consumed while scaling down.
用于芯片封装的微通道细间距互连化学镀量产模型的流体化学多物理场数值模拟
目前用于细间距互连的芯片封装技术需要高热量和高压力,这可能导致在缩小过程中周围的脆弱部件发生故障。通过使用化学镀,可以避免这些限制,这已经在各种实验中得到了证明。然而,从实验室实验到工业制造的转变必须面临各种挑战。一个数值多物理模型来研究流体化学方面,同时缩小了可能的大规模生产的几何形状。通过使用该模型,可以估计和研究包装系统可能存在的限制、理论要求和优化。结果表明,对于多孔介质,模型的压力梯度符合达西定律。此外,具有间隙的柱式联轴器通常具有不均匀的生长行为。这种不均匀性可以通过应用圆顶柱尖来优化。此外,对流通量在大多数样品中占主导地位。只有接近反应表面,扩散才成为质量传递的一个相关部分。对cu离子浓度梯度的研究表明,随着尺寸的缩小,消耗的cu离子越来越多。
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