A reliable and cost-effective assembly process for quick prototyping with GaN FETs and other flip-chip packages

Luke L. Jenkins, C. Wilson, J. Moses, Jeffrey M. Aggas, R. Dean
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引用次数: 2

Abstract

As transistors rapidly move to smaller packages, reliable prototyping becomes increasingly difficult. Ideally, high accuracy placement machines are preferred for device placement but are not practical for low-volume production. Here, a novel manual assembly process is applied to the 400 μm pitch EPC GaN FETs that has resulted in near 100% yield and exceptional reliability. The process requires a soldering iron and a reflow oven. An X-Ray image is preferred to verify alignment, but a successful alternate method is also presented. This assembly process, which can be applied to other flip chip and chip-scale packaging, will save time and resources in the development of new products employing wide bandgap power devices like EPC GaN FETs, and it has delivered significantly greater yield than alternative published methods.
用于GaN fet和其他倒装芯片封装的快速原型设计的可靠且具有成本效益的组装工艺
随着晶体管迅速向更小的封装转变,可靠的原型设计变得越来越困难。理想情况下,高精度的贴片机是器件贴片的首选,但对于小批量生产是不实用的。在这里,一种新的手工组装工艺应用于400 μm间距的EPC GaN场效应管,实现了接近100%的良率和卓越的可靠性。这个过程需要烙铁和回流炉。首选x射线图像来验证对准,但也提出了一种成功的替代方法。这种组装工艺可以应用于其他倒装芯片和芯片级封装,将节省使用EPC GaN fet等宽带隙功率器件开发新产品的时间和资源,并且其产量明显高于其他已发表的方法。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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