Design and synthesis of self-checking VLSI circuits and systems

Abstract

Self-checking circuits and systems can detect the presence of both transient and permanent faults. The advantage of such a system is that errors can be caught as soon as they occur, and thus data contamination is prevented. Although much effort has been concentrated on the design of self-checking checkers by previous researchers, very few results have been presented for the design of self-checking functional circuits, and fewer still for the design of self-checking systems. Methods are explored for the cost-effective design of combinational and sequential functional circuits, checkers and systems.<>