Stable switching of resistive random access memory on the nanotip array electrodes

K. Tsai, Chih-Hsiang Ho, W. Chang, Jr-jian Ke, Elif S. Mungan, Yuh‐Lin Wang, Jr-hau He
{"title":"Stable switching of resistive random access memory on the nanotip array electrodes","authors":"K. Tsai, Chih-Hsiang Ho, W. Chang, Jr-jian Ke, Elif S. Mungan, Yuh‐Lin Wang, Jr-hau He","doi":"10.1109/DRC.2016.7548428","DOIUrl":null,"url":null,"abstract":"We have demonstrated that ZnO resistive memory with a nanostructured substrate has great potential in improving ReRAM's RS characteristics. The electric field concentrated on nanotip structures is believed to play a crucial role for lowering Vf and Vset. The uniformity of the nanostructures is also important for the optimization of device performance, as well as improving the switching uniformity and reliability. Combining with the fact that fabrication process has low-cost merit with excellent stability and scalability, the nanotip array is highly attractive for cost-effective ReRAM applications and for the device miniaturization.","PeriodicalId":310524,"journal":{"name":"2016 74th Annual Device Research Conference (DRC)","volume":"67 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-06-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 74th Annual Device Research Conference (DRC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DRC.2016.7548428","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

We have demonstrated that ZnO resistive memory with a nanostructured substrate has great potential in improving ReRAM's RS characteristics. The electric field concentrated on nanotip structures is believed to play a crucial role for lowering Vf and Vset. The uniformity of the nanostructures is also important for the optimization of device performance, as well as improving the switching uniformity and reliability. Combining with the fact that fabrication process has low-cost merit with excellent stability and scalability, the nanotip array is highly attractive for cost-effective ReRAM applications and for the device miniaturization.
电阻式随机存储器在纳米尖端阵列电极上的稳定开关
我们已经证明了纳米结构衬底的ZnO电阻性存储器在改善ReRAM的RS特性方面具有很大的潜力。集中在纳米针尖结构上的电场对降低Vf和Vset起着至关重要的作用。纳米结构的均匀性对于优化器件性能、提高开关的均匀性和可靠性也很重要。结合制造工艺成本低、稳定性好、可扩展性强的特点,纳米尖端阵列在具有成本效益的ReRAM应用和器件小型化方面具有很高的吸引力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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