A 13-bit Radiation-Hardened SAR-ADC with Error Correction by Adaptive Topology Transformation

Yuya Aoki, Tatsuya Iwata, Takuji Miki, Kazutoshi Kobayashi, Takefumi Yoshikawa
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Abstract

A 13-bit radiation-hardened-by-design (RHBD) successive approximation register ADC (SAR-ADC) has been proposed with almost no area overhead. The RHBD SAR-ADC has a differential topology with a couple of radiation detectors, and these radiation detectors are assigned, one for each of the differential data paths. The ADC transforms the topology adaptively from differential to single based on the result of radiation detection for error correction or reduction. Thanks to the error correction or reduction by the Adaptive Topology Transformation (ATT), measurement results show an order of magnitude improvement in cross-section and more than 10 dB SNDR enhancement under over 106 count/cm2 irradiation condition.
基于自适应拓扑变换纠错的13位抗辐射SAR-ADC
提出了一种几乎没有面积开销的13位辐射强化设计(RHBD)逐次逼近寄存器ADC (SAR-ADC)。RHBD SAR-ADC具有具有一对辐射探测器的差分拓扑,并且这些辐射探测器是分配的,每个差分数据路径一个。ADC根据辐射检测的结果自适应地将拓扑从微分变换为单,以校正或减小误差。由于自适应拓扑变换(ATT)的误差校正或减小,测量结果显示,在超过106个计数/cm2的辐照条件下,截面改善了一个数量级,SNDR增强了10 dB以上。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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