Towards multiphysics simulations of integrated circuits

M. Garci, J. Kammerer, L. Hébrard
{"title":"Towards multiphysics simulations of integrated circuits","authors":"M. Garci, J. Kammerer, L. Hébrard","doi":"10.1109/ICECS.2014.7050114","DOIUrl":null,"url":null,"abstract":"Although the electrical benefits are greatly increasing in miniaturized integrated circuits, their corresponding design and reliability issues are also being raised. This work aims at the multiphysics simulation of integrated circuits that allows the designer to monitor the electrical, thermal and mechanical long term behaviour of the circuit from its early design stages. The multi-physics simulation tool is based on the direct method where three networks, i.e. an electrical, a thermal and a mechanical network, are directly linked and simulated with a unique circuit simulator. The tool was developed in a standard CAD environment, i.e. Cadence®. The way the three networks are built is described. In addition, to achieve multiphysics simulations, conventional CMOS models have to be replaced by specific multiphysics models that take additional physical effects into account, such as thermal effects, hot carriers induced ageing and their impact on the device performances. The modelling approaches as well as some simulation results are provided. Finally, the paper discusses the remaining prospective work to be able to perform electro-thermo-mechanical simulations of complex integrated systems.","PeriodicalId":133747,"journal":{"name":"2014 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 21st IEEE International Conference on Electronics, Circuits and Systems (ICECS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICECS.2014.7050114","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Although the electrical benefits are greatly increasing in miniaturized integrated circuits, their corresponding design and reliability issues are also being raised. This work aims at the multiphysics simulation of integrated circuits that allows the designer to monitor the electrical, thermal and mechanical long term behaviour of the circuit from its early design stages. The multi-physics simulation tool is based on the direct method where three networks, i.e. an electrical, a thermal and a mechanical network, are directly linked and simulated with a unique circuit simulator. The tool was developed in a standard CAD environment, i.e. Cadence®. The way the three networks are built is described. In addition, to achieve multiphysics simulations, conventional CMOS models have to be replaced by specific multiphysics models that take additional physical effects into account, such as thermal effects, hot carriers induced ageing and their impact on the device performances. The modelling approaches as well as some simulation results are provided. Finally, the paper discusses the remaining prospective work to be able to perform electro-thermo-mechanical simulations of complex integrated systems.
集成电路的多物理场仿真
虽然微型化集成电路的电气效益大大提高,但其相应的设计和可靠性问题也随之提出。这项工作旨在集成电路的多物理场模拟,使设计师能够从早期设计阶段监测电路的电气,热和机械长期行为。多物理场仿真工具基于直接方法,其中三个网络,即电网络,热网络和机械网络,直接连接并使用独特的电路模拟器进行仿真。该工具是在标准的CAD环境中开发的,即Cadence®。本文描述了这三种网络的构建方式。此外,为了实现多物理场模拟,传统的CMOS模型必须被特定的多物理场模型所取代,这些模型考虑了额外的物理效应,如热效应、热载流子诱导老化及其对器件性能的影响。给出了建模方法和一些仿真结果。最后,本文讨论了为实现复杂集成系统的电-热-机械模拟而需要进行的后续工作。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信