Single event effect testing of the Intel 80386 family and the 80486 microprocessor

Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems Pub Date : 1995-09-18 DOI:10.1109/RADECS.1995.509788

A. Moran, K. Label, M. Gates, C. Seidleck, R. McGraw, M. Broida, J. Firer, S. Sprehn

引用次数: 17

Abstract

We present single event effect test results for the Intel 80386 microprocessor, the 80387 coprocessor, the 82380 peripheral device, and on the 80486 microprocessor. Both single event upset and latchup conditions were monitored.

查看原文本刊更多论文

Intel 80386家族和80486微处理器的单事件效应测试

本文给出了在Intel 80386微处理器、80387协处理器、82380外设设备和80486微处理器上的单事件效应测试结果。监测了单事件扰动和闭锁条件。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

Proceedings of the Third European Conference on Radiation and its Effects on Components and Systems

自引率

0.00%

发文量