Microcontroller tracing in Hardware in the Loop tests integrating trace port measurement capability into NI VeriStand

B. Scherer, G. Horváth
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引用次数: 5

Abstract

Developing software for safety critical embedded systems requires extensive testing, and HIL (Hardware in the Loop) test has one of the most important roles in this testing process. Modern microcontrollers can provide opportunities to improve the efficiency and capability of traditional HIL testing. Many of these opportunities are connected to their internal so called Trace interfaces. This paper shortly introduces the capabilities of these Trace interfaces, and presents the way to integrate them into a professional HIL test development environment the NI VeriStand. The integration process starts with the acquisition of Trace signals, which requires a high speed FPGA based solution, and then a way to capture and process the data at the VeriStand engine level (usually runs on a real-time target), and at the Workspace level (Host PC) is described. The paper ends with the conclusion, which analyzes the throughput and capabilities of the integrated Trace interface and shows the possible application of the data captured by it.
微控制器跟踪硬件在环测试集成跟踪端口测量能力到NI VeriStand
为安全关键的嵌入式系统开发软件需要大量的测试,而HIL(硬件在环)测试在这个测试过程中扮演着最重要的角色之一。现代微控制器可以为提高传统HIL测试的效率和能力提供机会。这些机会中的许多都连接到它们的内部所谓的Trace接口。本文简要介绍了这些Trace接口的功能,并介绍了将它们集成到专业的HIL测试开发环境NI VeriStand中的方法。集成过程从跟踪信号的采集开始,这需要基于高速FPGA的解决方案,然后描述了在VeriStand引擎级别(通常在实时目标上运行)和工作空间级别(主机PC)捕获和处理数据的方法。文章最后给出了结论,分析了集成Trace接口的吞吐量和功能,并展示了该接口捕获数据的可能应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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