{"title":"Forward transit delay in In/sub 0.53/Ga/sub 0.47/As heterojunction bipolar transistors with nonequilibrium electron transpor","authors":"J. Laskar, R. N. Noltenburg, A. Levi","doi":"10.1109/DRC.1993.1009592","DOIUrl":null,"url":null,"abstract":"The microwave performance of high speed InP/In 0.53 Ga 0.47 As Heterojunction bipolar transistors is measured in the temperature range 55 K≤T≤340 K. The extrinsic unity currents gain cut-off frequency is f T =130 GHz at temperature T=340 K increasing to f T =300 GHz at T=55 K. The intrinsic emitter-collector forward delay decreases with decreasing temperature from T F =0.5 ps at T=340 K to a saturated value of T F =0.28 ps for temperatures T≤150 K. Such behavior may only be explained by the presence of non-equilibrium electron transport in the base and collector of the device","PeriodicalId":310841,"journal":{"name":"51st Annual Device Research Conference","volume":"82 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"51st Annual Device Research Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DRC.1993.1009592","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The microwave performance of high speed InP/In 0.53 Ga 0.47 As Heterojunction bipolar transistors is measured in the temperature range 55 K≤T≤340 K. The extrinsic unity currents gain cut-off frequency is f T =130 GHz at temperature T=340 K increasing to f T =300 GHz at T=55 K. The intrinsic emitter-collector forward delay decreases with decreasing temperature from T F =0.5 ps at T=340 K to a saturated value of T F =0.28 ps for temperatures T≤150 K. Such behavior may only be explained by the presence of non-equilibrium electron transport in the base and collector of the device