On Increasing Signal Integrity with Minimal Decap Insertion in Area-Array SoC Floorplan Design

Chao-Hung Lu, Hung-Ming Chen, C. Liu
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引用次数: 7

Abstract

With technology further scaling into deep submicron era, power supply noise become an important problem. Power supply noise problem is getting worse due to serious IR-drop and simultaneous switching noise, and decoupling capacitance (decap) insertion is commonly applied to alleviate the noise. There exist some approaches to addressing this issue, but they suffer either from over-design problem or late decap insertion during design stage. In this paper, we propose a methodology to insert decap in a more efficient and effective way during early design stage in area-array designs. The experimental results are encouraging. Compared with other approaches in (Zhao et al., 2002) and (Yan et al., 2005), we have inserted enough decap to meet supply noise constraint while others employ more area.
区域阵列SoC平面设计中以最小封装插入提高信号完整性的研究
随着技术进一步进入深亚微米时代,电源噪声成为一个重要的问题。由于严重的ir下降和同步开关噪声,电源噪声问题日益严重,通常采用去耦电容(decap)插入来缓解噪声。目前已有一些解决这一问题的方法,但它们要么存在设计过度的问题,要么存在设计阶段后期封盖插入的问题。在本文中,我们提出了一种在区域阵列设计的早期阶段以更有效的方式插入decap的方法。实验结果令人鼓舞。与(Zhao et al., 2002)和(Yan et al., 2005)中的其他方法相比,我们插入了足够的decap来满足供应噪声约束,而其他方法则使用了更多的面积。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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